Kammrath & Weiss REM-compatible tensile tester
Mobile tensile testing machine for testing samples under various types of microscopes, including inside a scanning electron microscope
Technical Specifications:
- Max. force: ±5 kN
- Max Displacement: 50 mm
- Displacement resolution: 100 nm
- Force resolution: 0.01% x FS
- Speed: 0.3…50 μm/s
- Max. sample size: 60 x 16 mm
- Test modes: Tension and compression
- Control types: Force and displacement control
- Machine dimensions: 220x15x55 mm (LxBxH)
- Machine Weight: ~2.4 kg
- Available load cells: 20 N (additional capacities available on request)
- Clamp design adjustable for various sample types
- Compatible with scanning-electron- light- and 2-photon microscope (fits under most optical measurement systems)
- Number of available systems: 1
