Nanoimaging Lab

The Nanoimaging Lab makes it possible to link macroscopic component properties with local structures at the nanoscale – a key challenge in modern materials research. 

The laboratory combines Raman and photoluminescence spectroscopy with atomic force microscopy (AFM) to measure electrical, topographical and optical properties with nanometre resolution. Key components are:

• LabRAM system for confocal PL and Raman mapping measurements (micrometre accuracy, temperature-dependent)
• AFM integration for colocalised optical and topographical measurements
• Electrical AFM modes (c-AFM, KPFM) for investigating conductivity and surface potential
• Measurements under N₂ atmosphere to control the sample environment

This infrastructure enables multidimensional analysis of functional materials, e.g. for optimising solar cells or memristors.