School of Engineering

Kammrath & Weiss REM-compatible tensile tester

Mobile tensile testing machine for testing samples under various types of microscopes, including inside a scanning electron microscope

Technical Specifications: 

  • Max. force: ±5 kN
  • Max Displacement: 50 mm
  • Displacement resolution: 100 nm
  • Force resolution: 0.01% x FS
  • Speed: 0.3…50 μm/s
  • Max. sample size: 60 x 16 mm
  • Test modes: Tension and compression
  • Control types: Force and displacement control
  • Machine dimensions: 220x15x55 mm (LxBxH)
  • Machine Weight: ~2.4 kg
  • Available load cells: 20 N (additional capacities available on request)
  • Clamp design adjustable for various sample types
  • Compatible with scanning-electron- light- and 2-photon microscope (fits under most optical measurement systems)
  • Number of available systems: 1

Virtual Lab Tour

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