Dr. Krzysztof Kryszczuk

Dr. Krzysztof Kryszczuk

Dr. Krzysztof Kryszczuk
ZHAW Life Sciences und Facility Management
Einsiedlerstrasse 31a
8820 Wädenswil

+41 (0) 58 934 53 37
krzysztof.kryszczuk@zhaw.ch

Persönliches Profil

Leitungsfunktion

  • Leitung Predictive Analytics Group (FS)

Tätigkeit an der ZHAW als

Senior Research Associate in Pattern Recognition and Machine Learning

https://www.zhaw.ch/de/lsfm/institute-zentren/ias/forschung/predictive-analytics/

Arbeits- und Forschungsschwerpunkte, Spezialkenntnisse

Pattern Recognition, Machine Learning, Predictive and Prescriptive Analytics, Image Processing, Signal Processing, Ensemble Methods

Aus- und Fortbildung

PhD in Pattern Recognition (EPFL Lausanne, Switzerland)
MS in Cognitive Systems Engineering (Rensselaer Polytechnic Institute, USA)
BS/MS in Electrical Engineering (Lublin Technical Univarsity, Poland)

Mitglied in Netzwerken

Projekte

Projektleitung

Mitarbeit an folgenden Projekten

Publikationen

Beiträge, peer-reviewed

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Bayesian Framework for Mobility Pattern Discovery Using Mobile Network Events

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In: Proceedings of EUSIPCO 2017. www.eusipco2017.org. Kos: EURASIP. Peer reviewed.

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Detecting Obfuscated JavaScripts Using Machine Learning

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ICIMP 2016 - The Eleventh International Conference on Internet Monitoring and Protection, 1 11-17. Peer reviewed.

Beiträge, nicht peer-reviewed

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A contrast correction algorithm for non-uniform illumination compensation

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In: Proc. of NOLTA 2014. Luzern: NOLTA.

Publikationen vor Tätigkeit an der ZHAW

Replacing design rules in the VLSI design cycle, Paul Hurley and Krzysztof Kryszczuk, Proceedings of SPIE Vol. 8327, Design for Manufacturability through Design Process Integration VI, March 2012

Direct printability prediction in VLSI using features from orthogonal transforms, Krzysztof Kryszczuk and Paul Hurley and Robert Sayah, IAPR International Conference on Pattern Recognition, Istanbul, August 2010

Handling high dimensionality in biometric classification with multiple quality measures using Locality Preserving Projection, Krzysztof Kryszczuk and Norman Poh, accepted to: IEEE Conference on Computer Vision and Pattern Recognition, Workshop on Biometrics, San Francisco, June 2010

Estimation of the number of clusters using multiple clustering validity indices, Krzysztof Kryszczuk and Paul Hurley, 9th Internaltional Workshop on Multiple Classifier Systems, Cairo, April 2010

Impact of combining quality measures on biometric sample matching, K. Kryszczuk, J. Richiardi, A. Drygajlo, IEEE 3rd International Conference on Biometrics: Theory, Applications and Systems, Washington DC, September 2009

Improving biometric verification with class-independent quality information, K. Kryszczuk, A. Drygajlo, IET Signal Processng 3(4), 2009, Special Issue on Biometric Recognition, Page(s): 310 - 321 DOI : 10.1049/iet-spr.2008.0174

Static models of derivative-coordinates phase spaces for multivariate time series classification: an application to signature verification, J. Richiardi, K. Kryszczuk, A. Drygajlo, International Conference on Biometrics (ICB) 2009, Alghero, Italy, July 2009

Impact of feature correlations on separation between bivariate normal distributions, K. Kryszczuk, A. Drygajlo, International Conference on Pattern Recognition (ICPR) 2008, Tampa FL, USA, December 2008

What do quality measures predict in biometrics?, K. Kryszczuk, A. Drygajlo, 16th European Conference on Signal Processing EUSIPCO 2008, Lausanne, Switzerland, August 2008

On quality of quality measures for classification, K. Kryszczuk, A. Drygajlo, BIOID 2008, Roskilde, Denmark, May 2008

Credence estimation and error prediction in biometric identity verification, K. Kryszczuk, A. Drygajlo, Signal Processing, Volume 88 , Issue 4 (April 2008), Pages: 916-925, ISSN:0165-1684 , April 2008

Quality measures in unimodal and multimodal biometric verification, J. Richiardi, K. Kryszczuk, A. Drygajlo, 15th European Conference on Signal Processing EUSIPCO 2007, Poznan, Poland.

Improving classification with class-independent quality measures: Q − stack in face verification, K. Kryszczuk, A. Drygajlo, 2nd International Conference in Biometrics ICB2007, Seoul Korea, August 2007

Reliability estimation for multimodal error prediction and fusion, K. Kryszczuk, J.Richiardi, A. Drygajlo, 7th International Workshop on Pattern Recognition in Information Systems (PRIS-2007), Funchal, Portugal

Q − stack: uni- and multimodal classifier stacking with quality measures, K. Kryszczuk, A. Drygajlo, 7th International Workshop on Multiple Classifier Systems 2007, Prague, Czech Republic

Reliability-based decision fusion in multimodal biometric verification systems, K. Kryszczuk, J.Richiardi, P.Prodanov, A. Drygajlo, EURASIP Journal on Advances in Signal Processing Volume 2007 (2007), Article ID 86572, 9 pages, doi:10.1155/2007/86572

Quality Dependent Fusion of Intramodal and Multimodal Biometric Experts, J. Kittler, N. Poh, O. Fatukasi, K. Messer, K. Kryszczuk, J. Richiardi and A. Drygajlo, Proc. of SPIE Defense & Security, 9–13 April 2007, Orlando, Florida USA.

Singular point detection in fingerprints using quadrant change information, K. Kryszczuk, A. Drygajlo, Proc. of the International Conference on Pattern Recognition (ICPR) 2006, Hong Kong, China.

On Combining Evidence For Reliability Estimation In Face Verification, K. Kryszczuk, A. Drygajlo, Proc. of the 14th European Conference on Signal Processing (EUSIPCO) 2006, Florence, Italy

On Face Quality Measures, K. Kryszczuk, A. Drygajlo, Proc. 2nd Workshop on Multimodal User Authentication, Toulouse, France, 2006

Robust Method of Reference Point Localization in Fingerprints, K. Kryszczuk, A. Drygajlo, Proc. COST 275 Workshop on Biometrics on the Internet, Hatfield, UK, pp. 7-10, Oct 2005

Error Handling In Multimodal Biometric Systems Using Reliability Measures, K. Kryszczuk, J.Richiardi, P.Prodanov, A. Drygajlo, Proc. of the 13th European Conference on Signal Processing EUSPICO 2004, Antalya, Turkey, 4-8 September 2005.

Addressing the vulnerabilities of likelihood-ratio-based face verification, K. Kryszczuk, A. Drygajlo, AVBPA 2005, Rye Brook, NY 2005

Face authentication competition on the BANCA database, K. Messer, J. Kittler, M. Sadeghi, M. Hamouz, A. Kostyn, S. Marcel, S. Bengio, F. Cardinaux, C. Sanderson, N. Poh, Y. Rodriguez, K. Kryszczuk, J. Czyz, L. Vandendorpe, J. Ng, H. Cheung, and B. Tang , Proceedings of the International Conference on Biometric Authentication ICBA 2004

Study of the Distinctiveness of Level 2 and Level 3 Features in Fragmentary Fingerprint Comparison, K. Kryszczuk, P. Morier, A. Drygajlo, Proc. of the Biometrioc Authentication Workshop, ICCV 2004, May 15, 2004, Prague

Extraction of Level 2 and Level 3 Features for Fragmentary Fingerprint Comparison, K. Kryszczuk, A. Drygajlo and P. Morier, Proc. of COST275 meeting, March 25-26, 2004 Vigo, Spain

Color Correction For Face Detection Based on Human Visual Perception Metaphor, K. Kryszczuk, A. Drygajlo, Proc. of the Workshop on Multimodal User Authentication, Dec. 11-12, 2003, Santa Barbara, CA USA, pp. 138-143

In-Building Location Systems Are Realized with Fluorescent Lamp Infrastructures, M. Perkins, B. Stengel, B. O'Dea, K. Kryszczuk, Journal of the IES, vol. 31, no. 1, 2002, pp. 61-69

Detection of Slow Light Level Reduction, K. Kryszczuk, P. R. Boyce, Journal of the IES, vol. 31, no. 2, 2002, pp. 3-10

Detection of Slow Light Level Reduction, K. Kryszczuk, Conference of the IESNA, Vancouver, Canada, July 2002